{"id":21064,"date":"2021-12-30T00:00:00","date_gmt":"2021-12-30T00:00:00","guid":{"rendered":"https:\/\/www.he-arc.ch\/prestations-services-equipements\/microscopie-electronique-a-balayage-meb\/"},"modified":"2024-02-06T12:27:24","modified_gmt":"2024-02-06T11:27:24","slug":"microscopie-electronique-a-balayage-meb","status":"publish","type":"he-arc_equipment","link":"https:\/\/www.he-arc.ch\/en\/prestations-services-equipements\/microscopie-electronique-a-balayage-meb\/","title":{"rendered":"Microscopie \u00e9lectronique \u00e0 balayage (MEB)"},"content":{"rendered":"\n<h2 class=\"wp-block-heading\">But<\/h2>\n\n\n\n<p>Imagerie de surfaces \u00e0 haute r\u00e9solution spatiale avec contraste topographique et\/ou chimique<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">Exemples d&#8217;application<\/h2>\n\n\n\n<p>Imagerie structurale, de d\u00e9fauts, \u00e9tat de surface, corrosion, etc.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">Possibilit\u00e9s et restrictions<\/h2>\n\n\n\n<ul>\n<li>Possibilit\u00e9 de coupler avec la microanalyse EDS<\/li>\n\n\n\n<li>R\u00e9solution spatiale jusqu&#8217;\u00e0 quelques nm<\/li>\n\n\n\n<li>Analyse non destructive de surfaces solides ou sur coupe m\u00e9tallograhique<\/li>\n\n\n\n<li>L&#8217;\u00e9chantillon doit \u00eatre conducteur ou doit pouvoir \u00eatre rendu conducteur par d\u00e9position d&#8217;une tr\u00e8s mince couche m\u00e9tallique<\/li>\n\n\n\n<li>Dimension max. de l&#8217;\u00e9chantillon: jusqu&#8217;\u00e0 quelques cm.<\/li>\n<\/ul>\n\n\n\n<h2 class=\"wp-block-heading\">Equipements<\/h2>\n\n\n\n<p>JEOL JSM-6400.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">Contact<\/h2>\n\n\n\n<div id=\"contact-card-block_a782ae778e930d40c18ecd8ad6702864\" class=\"contact-card is-shadowed mb-2-5 is-not-contained\">\n  <div class=\"contact-card__inner\">\n                <div class=\"contact-entry mb-1\">\n        Stephan Ramseyer\n      <\/div>\n                      <div class=\"contact-entry mb-1\">\n        <a href=\"tel:+41329302625\"  class=\"simple-link contact-entry mb-1\">+41 32 930 26 25<\/a>\n      <\/div>\n                      <div class=\"contact-entry \">\n        <a href=\"mailto:stephan.ramseyer@he-arc.ch\"  class=\"simple-link contact-entry mb-1\">stephan.ramseyer@he-arc.ch<\/a>\n      <\/div>\n            <\/div>\n<\/div>\n","protected":false},"author":16,"featured_media":15031,"template":"","he-arc_domain":[3],"he-arc_project_skill":[65],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v20.13 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Microscopie \u00e9lectronique \u00e0 balayage (MEB) - Haute-Ecole Arc<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.he-arc.ch\/en\/prestations-services-equipements\/microscopie-electronique-a-balayage-meb\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Microscopie \u00e9lectronique \u00e0 balayage (MEB) - Haute-Ecole Arc\" \/>\n<meta property=\"og:description\" content=\"But Imagerie de surfaces \u00e0 haute r\u00e9solution spatiale avec contraste topographique et\/ou chimique Exemples d&#8217;application Imagerie structurale, de d\u00e9fauts, \u00e9tat de surface, corrosion, etc. Possibilit\u00e9s et restrictions Equipements JEOL JSM-6400. 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